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課程名稱 |
高科技產業材料應用與分析
MATERIALS APPLICATIONS AND ANALYSIS IN HIGH-TECH INDUSTRY |
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開課學期 |
99-1 |
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授課對象 |
工學院 應用力學研究所 |
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授課教師 |
陳建彰 |
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課號 |
AM7058 |
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課程識別碼 |
543EM5240 |
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班次 |
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學分 |
3 |
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全/半年 |
半年 |
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必/選修 |
選修 |
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上課時間 |
星期五6,7,8(13:20~16:20) |
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上課地點 |
應107 |
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備註 |
本課程以英語授課。本課程以英語授課。
總人數上限：35人 |
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Ceiba 課程網頁 |
http://ceiba.ntu.edu.tw/991Matter |
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課程簡介影片 |
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核心能力關聯 |
核心能力與課程規劃關聯圖 |
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課程大綱
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為確保您我的權利,請尊重智慧財產權及不得非法影印
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課程概述 |
The detailed content of this course will be updated every year. In this semister, the content will include the semiconductor fundamentals, solar cells and materials analysis tools. |
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課程目標 |
In this course, students will learn the fundamentals of semiconductor physics and solar cells, as well as the material analysis tools. The target is to help students build up insights for semiconductor and solar cell materials application, to train students using the materials R&D tools to improve the competitiveness in high-tech industries. |
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課程要求 |
General physics,
General chemistry,
Engineering Mathematics |
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預期每週課後學習時數 |
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Office Hours |
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指定閱讀 |
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參考書目 |
☆★Optoelectronics and Photonics, by S. O. Kasap, McGraw-Hill 2001.
☆★Solid State Electronic Devices, by B. G. Streetman, Prentice Hall.
☆★Physics of Solar Cells, by P. Wurfel, Wiley-VCH.
☆★Handbook of Photovoltaic Science and Engineering. Edited by A. Luque and
S. Hegedus, John Wiley & Sons, 2003.
☆ Principles of Electronic Materials and Devices, by S. O. Kasap, McGraw-
Hill 2005.
☆ Engineering Materials 1: An Introduction to Properties, Applications and
Design, by Michael F. Ashby and David R. H. Jones, Elsevier 2005.
☆ Scanning Electron Microscopy and X-ray Microanalysis, R. E. Lee, Prentice-
Hall, 1993.
☆ Elements of X-ray Diffraction, B. D. Cullity, Addison Wesley.
☆ Principles of instrumental analysis, by D. A. Skoog, F. J. Holler, S. R.
Crouch, Belmont, CA: Thomson Brooks/Cole, 2007.
Understanding Materials Science, Rolf E. Hummel, Springer, 1997.
Materials – Engineering, Science, Processing and Design, by M. Ashby, H.
Shercliff, and D. Cebon, Elsevier 2007.
Instrumental Methods of Analysis, H. H. Willard, L. L. Merritt Jr, J. A. Dean,
F. A. Settle Jr., Wadsworth.
Surface analysis techniques and applications, edt by W. Neagle, D. R. Randell,
Cambridge, Royal Society of Chemistry, 1990.
An introduction to surface analysis by XPS and AES, by J. F. Watts and J.
Wolstenholme, New York: J. Wiley, 2003.
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評量方式
(僅供參考) |
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週次 |
日期 |
單元主題 |
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Week 1 |
9/17 |
Semiconductor Fundamentals |
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Week 2 |
9/24 |
Semiconductor Fundamentals |
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Week 3 |
10/01 |
Semiconductor Fundamentals |
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Week 4 |
10/08 |
Semiconductor Fundamentals |
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Week 5 |
10/15 |
Semiconductor Fundamentals |
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Week 6 |
10/22 |
Semiconductor Fundamentals |
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Week 7 |
10/29 |
Solar cell fundamentals |
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Week 8 |
11/05 |
Solar cell fundamentals |
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Week 9 |
11/12 |
Solar cell fundamentals
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Week 10 |
11/19 |
Solar cell fundamentals |
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Week 11 |
11/26 |
Solar cell fundamentals |
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Week 12 |
12/03 |
Solar cell fundamentals |
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Week 13 |
12/10 |
Materials analysis |
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Week 14 |
12/17 |
Materials analysis |
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Week 15 |
12/24 |
Materials analysis |
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Week 16 |
12/31 |
Material analysis |
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Week 17 |
1/07 |
Oral reports |
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